ANGLE-OF-DEPOSITION EFFECTS IN EVAPORATED AMORPHOUS-GERMANIUM

被引：1

作者：

KINNEY, WI ^{[1
]}

CARGILL, GS ^{[1
]}

机构：

[1] YALE UNIV,DEPT ENGN & APPL SCI,NEW HAVEN,CT 06520

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1977年 / 40卷 / 01期

关键词：

D O I：

10.1002/pssa.2210400104

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：37 / 42

页数：6

共 11 条

[1] ANISOTROPY OF STRUCTURAL MODELS FOR AMORPHOUS MATERIALS [J].

ALBEN, R ;

CARGILL, GS ;

WENZEL, J .

PHYSICAL REVIEW B, 1976, 13 (02) :835-842

[2] MODIFIED DETECTION ARRANGEMENT FOR SCANNING ELECTRON DIFFRACTION INSTRUMENT [J].

DOVE, DB ;

DENBIGH, PN .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (12) :1687-&

[3] SCANNING ELECTRON DIFFRACTION ATTACHMENT WITH ELECTRON ENERGY FILTERING [J].

GRACZYK, JF ;

MOSS, SC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (03) :424-&

[4] SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (I) [J].

GRACZYK, JF ;

CHAUDHARI, P .

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1973, 58 (01) :163-179

[5] STUDY ON ANOMALOUSLY HIGH PHOTOVOLTAIC EFFECT IN GERMANIUM THIN-FILMS [J].

MA, W ;

ANDERSON, RM ;

HRUSKA, SJ .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) :2650-2657

[6] EFFECT OF VAPOR INCIDENCE ANGLES ON PROFILE AND PROPERTIES OF CONDENSED FILMS [J].

NAKHODKIN, NG ;

SHALDERVAN, AI .

THIN SOLID FILMS, 1972, 10 (01) :109-+

[7]

ORLOWSKI B, 1974, 20 AIP C P, P241

[8]

PAESLER MA, 1973, 5 INT C AM LIQ SEM G, P229

[9] OBLIQUELY DEPOSITED AMORPHOUS-GE FILMS .1. GROWTH AND STRUCTURE [J].

PANDYA, DK ;

RASTOGI, AC ;

CHOPRA, KL .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) :2966-2975

[10] STRUCTURAL VARIATION IN AMORPHOUS GE [J].

RUDEE, ML .

PHILOSOPHICAL MAGAZINE, 1973, 28 (05) :1149-1151

← 1 2 →