DETERMINATION OF TRACE-METALS BY MICROWAVE PLASMA SPECTROMETRY WITH AN ATMOSPHERIC-PRESSURE HELIUM DISCHARGE

被引：54

作者：

ZANDER, AT ^{[1
]}

HIEFTJE, GM ^{[1
]}

机构：

[1] INDIANA UNIV,DEPT CHEM,BLOOMINGTON,IN 47401

来源：

ANALYTICAL CHEMISTRY | 1978年 / 50卷 / 09期

关键词：

D O I：

10.1021/ac50031a016

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1257 / 1260

页数：4

共 12 条

[1] CAVITY FOR MICROWAVE-INDUCED PLASMAS OPERATED IN HELIUM AND ARGON AT ATMOSPHERIC-PRESSURE [J].

BEENAKKER, CIM .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1976, 31 (8-9) :483-486

[2] EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY [J].

BEENAKKER, CIM .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1977, 32 (3-4) :173-187

[3]

BEENAKKER CIM, 1977, MAR PITTSB C AN CHEM

[4] PHYSICAL AND ANALYTICAL ASPECTS OF A MICROWAVE EXCITED PLASMA [J].

FALLGATTER, K ;

SVOBODA, V ;

WINEFORDNER, JD .

APPLIED SPECTROSCOPY, 1971, 25 (03) :347-+

[5]

Gaydon A., 1974, SPECTROSCOPY FLAMES

[6] TALANTA REVIEW - PLASMA EMISSION SOURCES IN ANALYTICAL SPECTROSCOPY .2. [J].

GREENFIELD, S ;

MCGEACHIN, HM ;

SMITH, PB .

TALANTA, 1975, 22 (07) :553-562

[7] PHYSICAL PHENOMENA AND ANALYTICAL APPLICATIONS OF HELIUM MICROWAVE DISCHARGES [J].

HOUPT, PM .

ANALYTICA CHIMICA ACTA, 1976, 86 (OCT) :129-138

[8]

KOPP I, TABLE BAND FEATURES

[9] NEW, COMPUTER-CONTROLLED MICROWAVE DISCHARGE EMISSION SPECTROMETER EMPLOYING MICROARC SAMPLE ATOMIZATION FOR TRACE AND MICRO ELEMENTAL ANALYSIS [J].

LAYMAN, LR ;

HIEFTJE, GM .

ANALYTICAL CHEMISTRY, 1975, 47 (02) :194-202

[10]

Ramo S., 1953, FIELDS WAVES MODERN

← 1 2 →