EXTENDED X-RAY ABSORPTION FINE-STRUCTURE AND X-RAY STANDING WAVE STUDY OF THE CLEAN INP(110) SURFACE RELAXATION

被引：13

作者：

WOICIK, JC

KENDELEWICZ, T

MIYANO, KE

COWAN, PL

RICHTER, M

KARLIN, BA

BOULDIN, CE

PIANETTA, P

SPICER, WE

机构：

[1] STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305

[2] ARGONNE NATL LAB,ARGONNE,IL 60439

[3] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

[4] NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 11973

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1992年 / 10卷 / 04期

关键词：

D O I：

10.1116/1.578021

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Through a unique combination of surface sensitive extended x-ray absorption fine structure (EXAFS) and x-ray standing waves (XSW), we have determined the pertinent structural parameters of the clean InP(110) surface reconstruction. We find a rotation angle of 27-degrees between the P-In chains, no change of the first neighbor P-In bond length, and a small but measurable, approximately 0.1 angstrom, expansion of the average P-P second neighbor distance. The general application of the EXAFS and XSW techniques to the study of clean surfaces will be discussed.

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页码：2041 / 2045

页数：5

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