ORIGIN OF RHEED INTENSITY OSCILLATIONS DURING THE GROWTH OF (Y,DY)BA2CU3O7-X THIN-FILMS

被引：20

作者：

ACHUTHARAMAN, VS ^{[1
]}

CHANDRASEKHAR, N ^{[1
]}

VALLS, OT ^{[1
]}

GOLDMAN, AM ^{[1
]}

机构：

[1] UNIV MINNESOTA,SCH PHYS & ASTRON,MINNEAPOLIS,MN 55455

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.50.8122

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We propose a mechanism for the origin of RHEED intensity oscillations during the growth of (Y,Dy)Ba2Cu3O7 thin films. Surface relaxation and RHEED intensity recovery observed during the growth of these materials are ascribed predominantly to the diffusion of already formed (Y,Dy)Ba2Cu3O7 units rather than to the chemical reaction of the constituents to form a unit cell. The validity of the model is demonstrated by comparing the surface step densities determined from results of Monte Carlo simulations with RHEED intensity oscillations observed during pulsed laser deposition.

引用

页码：8122 / 8125

页数：4

共 19 条

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