NEUTRON-DIFFRACTION STUDY OF THE STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON

被引：81

作者：

KUGLER, S

MOLNAR, G

PETO, G

ZSOLDOS, E

ROSTA, L

MENELLE, A

BELLISSENT, R

机构：

[1] HUNGARIAN ACAD SCI, CENT RES INST PHYS, H-1525 BUDAPEST, HUNGARY

[2] CENS, LAB LEON BRILLOUIN, CNRS, CEA, COMMUN LAB, F-91191 GIF SUR YVETTE, FRANCE

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.40.8030

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8030 / 8032

页数：3

共 32 条

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[10] STRUCTURAL DISORDER AND ELECTRONIC PROPERTIES OF AMORPHOUS SILICON
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