TEMPERATURE-DEPENDENCE OF THE NMR LINE SHIFTS AND T1-RELAXATION TIMES OF TE-125 IN THE SEMICONDUCTOR ALLOYS HG1-XCDXTE

The Te-125 NMR spectra of the semiconductor alloys Hg1-x(Cd)x(Te) are studied. The temperature dependence between 15 and 300 K of the frequency shifts and the T1 relaxation times of the five tellurium lines in the spectra of a set of Hg1-x(Cd)x(Te) polycrystalline samples with a large variety of x values are measured. In addition to those for samples prepared stiochiometrically, NMR results are recorded for samples containing an excess and a deficiency of metal atoms. The results are reported, and qualitative conclusions are made concerning the electronic interaction, chemical shift, and Knight shift contributions governing the NMR experimental parameters. This study demonstrates the ability of NMR spectroscopy to monitor and characterize the clusters hg4-n(Cd)n(Te) with n = 0-4 in the alloys separately.