EXPERIMENTS ON IMAGING X-RAY ANALYTICAL METHODS

被引:6
作者
GURKER, N
EBEL, MF
EBEL, H
HEDRICH, H
BAVDAZ, M
GIEFING, G
机构
关键词
D O I
10.1002/sia.740140402
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:163 / 169
页数:7
相关论文
共 34 条
[1]   IMAGING MULTIELEMENT ANALYSIS WITH SYNCHROTRON RADIATION EXCITED X-RAY-FLUORESCENCE RADIATION [J].
BAVDAZ, M ;
KNOCHEL, A ;
KETELSEN, P ;
PETERSEN, W ;
GURKER, N ;
SALEHI, MH ;
DIETRICH, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1988, 266 (1-3) :308-312
[2]   PHOTOELECTRON SPECTROMICROSCOPY [J].
BEAMSON, G ;
PORTER, HQ ;
TURNER, DW .
NATURE, 1981, 290 (5807) :556-561
[3]  
BOEHME DR, 1987, SAND878214 SAND REP
[4]  
CAZEAUX J, 1982, J APPL PHYS, V53, P3299
[7]  
GOHSHI Y, 1987, ADV XRAY ANAL, V31, P495
[8]   X-RAY MAPPING USING A NEW CODED IRRADIATION TECHNIQUE [J].
GURKER, N .
X-RAY SPECTROMETRY, 1985, 14 (02) :74-83
[9]   IMAGING XPS - A NEW TECHNIQUE .2. EXPERIMENTAL-VERIFICATION [J].
GURKER, N ;
EBEL, MF ;
EBEL, H ;
MANTLER, M ;
HEDRICH, H ;
SCHON, P .
SURFACE AND INTERFACE ANALYSIS, 1987, 10 (05) :242-249
[10]   IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES [J].
GURKER, N ;
EBEL, MF ;
EBEL, H .
SURFACE AND INTERFACE ANALYSIS, 1983, 5 (01) :13-19