IMAGING XPS - A NEW TECHNIQUE .2. EXPERIMENTAL-VERIFICATION

被引：15

作者：

GURKER, N

EBEL, MF

EBEL, H

MANTLER, M

HEDRICH, H

SCHON, P

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1987年 / 10卷 / 05期

关键词：

D O I：

10.1002/sia.740100504

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：242 / 249

页数：8

共 15 条

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[8] SELECTED AREA X-RAY PHOTO-ELECTRON SPECTROSCOPY [J].

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[9]

PETIT R, 1981, ANALUSIS, V9, P88

[10] SOFT X-RAYS AND FAST ATOMS AS IMAGE GENERATORS IN PHOTOELECTRON MICROSCOPY [J].

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NATURE, 1983, 303 (5918) :599-601

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