ABSOLUTE DETERMINATION OF THE FARAD AND THE OHM, AND MEASUREMENT OF THE QUANTIZED HALL RESISTANCE RH(2) AT LCIE

被引：18

作者：

DELAHAYE, F

DOMINGUEZ, D

BELLON, M

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1109/TIM.1987.6312669

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：205 / 207

页数：3

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