PRECISE QUANTIZED HALL RESISTANCE MEASUREMENTS IN GAAS/ALXGA1-XAS AND INXGA1-XAS/INP HETEROSTRUCTURES

被引：54

作者：

DELAHAYE, F

DOMINGUEZ, D

ALEXANDRE, F

ANDRE, JP

HIRTZ, JP

RAZEGHI, M

机构：

[1] CTR NATL ETUD TELECOMMUN,F-92220 BAGNEUX,FRANCE

[2] LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE

[3] THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE

来源：

METROLOGIA | 1986年 / 22卷 / 02期

关键词：

D O I：

10.1088/0026-1394/22/2/005

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

HALL EFFECT

引用

页码：103 / 110

页数：8

共 17 条

[1] HIGH-PRECISION MEASUREMENTS OF THE QUANTIZED HALL RESISTANCE AT THE PTB
BLIEK, L
BRAUN, E
MELCHERT, F
WARNECKE, P
SCHLAPP, W
WEIMANN, G
PLOOG, K
EBERT, G
DORDA, GE
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 304 - 305
[2] TEMPERATURE-DEPENDENCE OF THE QUANTUM HALL RESISTANCE
CAGE, ME
FIELD, BF
DZIUBA, RF
GIRVIN, SM
GOSSARD, AC
TSUI, DC
[J]. PHYSICAL REVIEW B, 1984, 30 (04): : 2286 - 2288
[3] A TEST OF THE QUANTUM HALL-EFFECT AS A RESISTANCE STANDARD
CAGE, ME
DZIUBA, RF
FIELD, BF
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 301 - 303
[4] PROGRESS IN RESISTANCE RATIO MEASUREMENTS USING A CRYOGENIC CURRENT COMPARATOR AT LCIE
DELAHAYE, F
REYMANN, D
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 316 - 319
[5] ELNEKAVE N, IEE C PUBLICATION, V152, P53
[6] MEASUREMENT SYSTEM FOR QUANTUM HALL-EFFECT UTILIZING A JOSEPHSON POTENTIOMETER
ENDO, T
MURAYAMA, Y
KOYANAGI, M
KINOSHITA, J
INAGAKI, K
YAMANOUCHI, C
YOSHIHIRO, K
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 323 - 327
[7] QUANTUM HALL EFFECT IN MODULATION DOPED IN0.53GA0.47AS-INP HETEROJUNCTIONS.
GULDNER, Y.
HIRTZ, J.P.
VIEREN, J.P.
VOISIN, P.
VOOS, M.
RAZEGHI, M.
[J]. 1982, V 43 (N 16): : 613 - 616
[8] A MEASUREMENT SYSTEM FOR THE DETERMINATION OF H/E2 IN TERMS OF THE SL OHM AND THE MAINTAINED OHM AT THE NPL
HARTLAND, A
DAVIES, GJ
WOOD, DR
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 309 - 314
[9] RAZEGHI M, 1985, SEMICONDUCT SEMIMET, V22, P299
[10] LOW-TEMPERATURE DIRECT-CURRENT COMPARATORS
SULLIVAN, DB
DZIUBA, RF
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (04) : 517 - 519

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