MICROSTRUCTURE OF LASER-DEPOSITED SUPERCONDUCTING ND1.85CE0.15CUO4-Y FILMS

被引:18
作者
BEESABATHINA, DP
SALAMANCARIBA, L
MAO, SN
XI, XX
VENKATESAN, T
机构
[1] UNIV MARYLAND,DEPT PHYS,CTR SUPERCONDUCT RES,COLL PK,MD 20742
[2] UNIV MARYLAND,DEPT ELECT ENGN,COLL PK,MD 20742
关键词
D O I
10.1063/1.109177
中图分类号
O59 [应用物理学];
学科分类号
摘要
The morphology and microstructure of Nd1.85Ce0.15CuO4-y (NCCO) films grown epitaxially on (100) LaAlO3 (LAO) by pulsed laser deposition were studied by selected-area electron diffraction and high-resolution electron microscopy. The films were composed primarily of c-axis oriented grains and did not contain any polytypoidic faulting. The in-plane epitaxial relationship of the films was found to be [100]NCCO //[001]LAO. The Nd1.85Ce0.15CUO4-y-LaAlO3 interface is sharp and free of defects. A weak peak around the (110) position of NCCO(T') structure in x-ray diffraction was observed. Using microdiffraction and energy-dispersive x-ray analysis, we confirmed that this peak corresponds to the (004) reflection of cubic Ce0.5Nd0.5O1.75.
引用
收藏
页码:3022 / 3024
页数:3
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