PSEUDOMORPHISM IN (100) NI-CU SYSTEM

被引：37

作者：

KUNTZE, R

CHAMBERS, A

PRUTTON, M

机构：

[1] Physics Department, University of York, Heslington, York

来源：

THIN SOLID FILMS | 1969年 / 4卷 / 01期

关键词：

D O I：

10.1016/0040-6090(69)90020-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-resolution electron diffraction patterns have been measured with a micro-densitometer, giving direct and unambiguous evidence of pseudomorphism. This technique is shown to give extremely accurate misfit values. The systems studied, Ni/(100)Cu and Cu/(100)Ni, show some remarkable differences. A tentative explanation for these, in terms of possible interference from oxide layers, is suggested. © 1969.

引用

页码：47 / &

共 43 条

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