ESTIMATION OF DMIN, LAMBDA-MIN AND LAMBDA-MAX FROM THE GNOMONIC PROJECTIONS OF LAUE PATTERNS

被引:13
作者
CRUICKSHANK, DWJ [1 ]
CARR, PD [1 ]
HARDING, MM [1 ]
机构
[1] UNIV LIVERPOOL,DEPT CHEM,LIVERPOOL L69 3BX,ENGLAND
关键词
D O I
10.1107/S0021889891012797
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The parameters d(min) and lambda(min), needed for the processing of synchrotron X-ray Laue patterns, may be estimated by simple formulae from the sizes of the clear gaps surrounding prominent zone lines in gnomonic projections. The estimation of lambda(min) is similarly considered. Examples are given.
引用
收藏
页码:285 / 293
页数:9
相关论文
共 11 条
  • [1] AMOROS JL, 1975, LAUE METHOD
  • [2] BELL RJT, 1944, COORDINATE GEOMETRY
  • [3] BRAVAIS MA, 1850, J ECOLE POLYTECHNIQU, V19, P1
  • [4] THE DETERMINATION OF UNIT-CELL PARAMETERS FROM LAUE DIFFRACTION PATTERNS USING THEIR GNOMONIC PROJECTIONS
    CARR, PD
    CRUICKSHANK, DWJ
    HARDING, MM
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 : 294 - 308
  • [5] ANGULAR-DISTRIBUTION OF REFLECTIONS IN LAUE DIFFRACTION
    CRUICKSHANK, DWJ
    HELLIWELL, JR
    MOFFAT, K
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 352 - &
  • [6] INSTRUMENTATION FOR LAUE DIFFRACTION
    HELLIWELL, JR
    HARROP, S
    HABASH, J
    MAGORRIAN, BG
    ALLINSON, NM
    GOMEZ, D
    HELLIWELL, M
    DEREWENDA, Z
    CRUICKSHANK, DWJ
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) : 1531 - 1536
  • [7] THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS
    HELLIWELL, JR
    HABASH, J
    CRUICKSHANK, DWJ
    HARDING, MM
    GREENHOUGH, TJ
    CAMPBELL, JW
    CLIFTON, IJ
    ELDER, M
    MACHIN, PA
    PAPIZ, MZ
    ZUREK, S
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 : 483 - 497
  • [8] MALLARD E, 1979, TRAITE CRISTALLOGRAP, V1
  • [9] Murdock CC, 1938, Z KRISTALLOGR, V99, P205
  • [10] Wyckoff R. W. G., 1924, STRUCTURE CRYSTALS