THE DETERMINATION OF UNIT-CELL PARAMETERS FROM LAUE DIFFRACTION PATTERNS USING THEIR GNOMONIC PROJECTIONS

被引：21

作者：

CARR, PD ^{[1
]}

CRUICKSHANK, DWJ ^{[1
]}

HARDING, MM ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT CHEM,MANCHESTER M60 1QD,LANCS,ENGLAND

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1992年 / 25卷

关键词：

D O I：

10.1107/S0021889891012803

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A method is described whereby the unit cell of a crystal and its orientation can be determined from a single Laue diffraction pattern (in transmission). The axial ratios and interaxial angles can be determined precisely, but the absolute scaling of the cell depends upon the accuracy with which the minimum wavelength for the experiment is known. Several examples are given.

引用

页码：294 / 308

页数：15

共 20 条

[1] AMOROS JL, 1975, LAUE METHOD
[2] Arndt U. W., 1977, ROTATION METHOD CRYS
[3] CARR PD, 1992, UNPUB J APPL CRYST
[4] ANGULAR-DISTRIBUTION OF REFLECTIONS IN LAUE DIFFRACTION
CRUICKSHANK, DWJ
HELLIWELL, JR
MOFFAT, K
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 352 - &
[5] ESTIMATION OF DMIN, LAMBDA-MIN AND LAMBDA-MAX FROM THE GNOMONIC PROJECTIONS OF LAUE PATTERNS
CRUICKSHANK, DWJ
CARR, PD
HARDING, MM
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 : 285 - 293
[6] HAJDU J, 1989, SYNCHROTRON RAD STRU, P331
[7] CRYSTAL-STRUCTURE DETERMINATION OF AN ORGANOMETALLIC COMPOUND FROM SYNCHROTRON RADIATION LAUE DIFFRACTION PHOTOGRAPHS
HARDING, MM
MAGINN, SJ
CAMPBELL, JW
CLIFTON, I
MACHIN, P
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1988, 44 : 142 - 146
[8] HARDING MM, 1990, COMMUNICATION
[9] INSTRUMENTATION FOR LAUE DIFFRACTION
HELLIWELL, JR
HARROP, S
HABASH, J
MAGORRIAN, BG
ALLINSON, NM
GOMEZ, D
HELLIWELL, M
DEREWENDA, Z
CRUICKSHANK, DWJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) : 1531 - 1536
[10] THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS
HELLIWELL, JR
HABASH, J
CRUICKSHANK, DWJ
HARDING, MM
GREENHOUGH, TJ
CAMPBELL, JW
CLIFTON, IJ
ELDER, M
MACHIN, PA
PAPIZ, MZ
ZUREK, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 : 483 - 497

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