CHOICE OF PHYSICAL PARAMETERS IN CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE ANALYSIS

被引：18

作者：

HERMAN, AW ^{[1
]}

MCNELLES, LA ^{[1
]}

CAMPBELL, JL ^{[1
]}

机构：

[1] UNIV GUELPH,DEPT PHYS,GUELPH NIG 2W1,ONTARIO,CANADA

来源：

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES | 1973年 / 24卷 / 12期

关键词：

D O I：

10.1016/0020-708X(73)90103-8

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：677 / 688

页数：12

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[9] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].

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