学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
PRESWITCHING ELECTRICAL PROPERTIES, FORMING, AND SWITCHING IN AMORPHOUS CHALCOGENIDE ALLOY THRESHOLD AND MEMORY DEVICES
被引:72
作者
:
BOSNELL, JR
论文数:
0
引用数:
0
h-index:
0
BOSNELL, JR
THOMAS, CB
论文数:
0
引用数:
0
h-index:
0
THOMAS, CB
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1972年
/ 15卷
/ 11期
关键词
:
D O I
:
10.1016/0038-1101(72)90047-0
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1261 / &
相关论文
共 15 条
[11]
GAS INCORPORATION INTO SPUTTERED FILMS
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
: 3928
-
&
[12]
D-C DIELECTRIC BREAKDOWN OF AMORPHOUS SILICON DIOXIDE FILMS AT ROOM TEMPERATURE
WORTHING, FL
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey
WORTHING, FL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(01)
: 88
-
+
[13]
1970, J NONCRYST SOLIDS, V2
[14]
1970, J NONCRYST SOLIDS, V4
[15]
1969, Patent No. 21218
←
1
2
→
共 15 条
[11]
GAS INCORPORATION INTO SPUTTERED FILMS
WINTERS, HF
论文数:
0
引用数:
0
h-index:
0
WINTERS, HF
KAY, E
论文数:
0
引用数:
0
h-index:
0
KAY, E
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(10)
: 3928
-
&
[12]
D-C DIELECTRIC BREAKDOWN OF AMORPHOUS SILICON DIOXIDE FILMS AT ROOM TEMPERATURE
WORTHING, FL
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey
WORTHING, FL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(01)
: 88
-
+
[13]
1970, J NONCRYST SOLIDS, V2
[14]
1970, J NONCRYST SOLIDS, V4
[15]
1969, Patent No. 21218
←
1
2
→