学术探索
学术期刊
新闻热点
数据分析
智能评审

STUDIUM VON EINZELVERSETZUNGEN IN NAHEZU IDEALEN KRISTALLEN MIT EINER RONTGENMETHODE

被引：13
作者：
MEIER, F
机构：
来源：
ZEITSCHRIFT FUR PHYSIK | 1962年 / 168卷 / 01期
关键词：
D O I：
10.1007/BF01418954
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：10 / &
相关论文
共 42 条
[31]   DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J].
LANG, AR .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) :597-598
[32]   THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].
LANG, AR .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (03) :249-250
[33]   STUDIES OF INDIVIDUAL DISLOCATIONS IN CRYSTALS BY X-RAY DIFFRACTION MICRORADIOGRAPHY [J].
LANG, AR .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (11) :1748-1755
[34]  
Laue M, 1960, RONTGENSTRAHLINTERFE
[35]  
Lonsdale K., 1947, MINERAL MAG, V28, P14
[36]   METHOD FOR THE DETECTION OF DISLOCATIONS IN SILICON BY X-RAY EXTINCTION CONTRAST [J].
NEWKIRK, JB .
PHYSICAL REVIEW, 1958, 110 (06) :1465-1466
[37]  
NEWKIRK JB, 1959, T AM I MIN MET ENG, V215, P483
[38]  
RIESSLER W, 1960, Z ANGEW PHYS, V12, P433
[39]  
SOMMERFELD A, 1945, MECHANIK DEFORMIERBA, P338
[40]   DISLOCATION STRUCTURE AND THE FORMATION AND STRENGTH OF SODIUM CHLORIDE WHISKERS [J].
WEBB, WW .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (01) :194-206
12345