CORRELATION OF PHOTOLUMINESCENCE MEASUREMENTS WITH THE COMPOSITION AND ELECTRONIC-PROPERTIES OF CHEMICALLY ETCHED CDTE SURFACES

被引:64
作者
SOBIESIERSKI, Z
DHARMADASA, IM
WILLIAMS, RH
机构
关键词
D O I
10.1063/1.100178
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2623 / 2625
页数:3
相关论文
共 15 条
  • [1] Basol B. M., 1985, Journal of Applied Physics, V58, P3809, DOI 10.1063/1.335595
  • [2] THRESHOLD ENERGY FOR ATOMIC DISPLACEMENT IN CADMIUM TELLURIDE
    BRYANT, FJ
    WEBSTER, E
    [J]. PHYSICA STATUS SOLIDI, 1967, 21 (01): : 315 - &
  • [3] SURFACE CHARACTERIZATION OF INP USING PHOTOLUMINESCENCE
    CHANG, RR
    IYER, R
    LILE, DL
    [J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (05) : 1995 - 2004
  • [4] DHARMADASA IM, 1989, APPL PHYS LETT, V54
  • [5] DHARMADASA IM, UNPUB
  • [6] DHARMADASA IM, 1986, 18TH P INT C PHYS SE, P379
  • [7] AUGER-ELECTRON SPECTROSCOPIC STUDY OF THE ETCHING OF CADMIUM TELLURIDE AND CADMIUM MANGANESE TELLURIDE
    FELDMAN, RD
    OPILA, RL
    BRIDENBAUGH, PM
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (05): : 1988 - 1991
  • [8] EXCITATION-SPECTRA OF EXCITON LUMINESCENCE IN CDTE
    HIESINGER, P
    SUGA, S
    WILLMANN, F
    DREYBRODT, W
    [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 67 (02): : 641 - 652
  • [9] KRAWCZYK S, 1984, ELECTRON LETT, V20, P657
  • [10] ETCHING ON POLAR (111) SURFACES OF CDTE CRYSTALS STUDIED WITH AUGER-ELECTRON SPECTROSCOPY
    LU, YC
    STAHLE, CM
    FEIGELSON, RS
    MORIMOTO, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (11) : 4453 - 4459