CORRELATION OF PHOTOLUMINESCENCE MEASUREMENTS WITH THE COMPOSITION AND ELECTRONIC-PROPERTIES OF CHEMICALLY ETCHED CDTE SURFACES

被引：64

作者：

SOBIESIERSKI, Z

DHARMADASA, IM

WILLIAMS, RH

机构：

来源：

关键词：

D O I：

10.1063/1.100178

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2623 / 2625

页数：3

共 15 条

[1] Basol B. M., 1985, Journal of Applied Physics, V58, P3809, DOI 10.1063/1.335595
[2] THRESHOLD ENERGY FOR ATOMIC DISPLACEMENT IN CADMIUM TELLURIDE
BRYANT, FJ
WEBSTER, E
[J]. PHYSICA STATUS SOLIDI, 1967, 21 (01): : 315 - &
[3] SURFACE CHARACTERIZATION OF INP USING PHOTOLUMINESCENCE
CHANG, RR
IYER, R
LILE, DL
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (05) : 1995 - 2004
[4] DHARMADASA IM, 1989, APPL PHYS LETT, V54
[5] DHARMADASA IM, UNPUB
[6] DHARMADASA IM, 1986, 18TH P INT C PHYS SE, P379
[7] AUGER-ELECTRON SPECTROSCOPIC STUDY OF THE ETCHING OF CADMIUM TELLURIDE AND CADMIUM MANGANESE TELLURIDE
FELDMAN, RD
OPILA, RL
BRIDENBAUGH, PM
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (05): : 1988 - 1991
[8] EXCITATION-SPECTRA OF EXCITON LUMINESCENCE IN CDTE
HIESINGER, P
SUGA, S
WILLMANN, F
DREYBRODT, W
[J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 67 (02): : 641 - 652
[9] KRAWCZYK S, 1984, ELECTRON LETT, V20, P657
[10] ETCHING ON POLAR (111) SURFACES OF CDTE CRYSTALS STUDIED WITH AUGER-ELECTRON SPECTROSCOPY
LU, YC
STAHLE, CM
FEIGELSON, RS
MORIMOTO, J
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (11) : 4453 - 4459