ETCHING ON POLAR (111) SURFACES OF CDTE CRYSTALS STUDIED WITH AUGER-ELECTRON SPECTROSCOPY

被引：21

作者：

LU, YC ^{[1
]}

STAHLE, CM ^{[1
]}

FEIGELSON, RS ^{[1
]}

MORIMOTO, J ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 11期

关键词：

D O I：

10.1063/1.339033

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4453 / 4459

页数：7

共 18 条

[1] RAMAN-SCATTERING STUDY OF THE PROPERTIES AND REMOVAL OF EXCESS TE ON CDTE SURFACES [J].

AMIRTHARAJ, PM ;

POLLAK, FH .

APPLIED PHYSICS LETTERS, 1984, 45 (07) :789-791

[2] AUGER-ELECTRON SPECTROSCOPIC STUDY OF THE ETCHING OF CADMIUM TELLURIDE AND CADMIUM MANGANESE TELLURIDE [J].

FELDMAN, RD ;

OPILA, RL ;

BRIDENBAUGH, PM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (05) :1988-1991

[3] ETCHING OF CADMIUM TELLURIDE [J].

GAUGASH, P ;

MILNES, AG .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (04) :924-926

[4] STUDIES OF CDTE SURFACES WITH SECONDARY ION MASS-SPECTROMETRY, RUTHERFORD BACKSCATTERING AND ELLIPSOMETRY [J].

HAGEALI, M ;

STUCK, R ;

SAXENA, AN ;

SIFFERT, P .

APPLIED PHYSICS, 1979, 19 (01) :25-33

[5] STUDY OF CLEAVED, OXIDIZED, ETCHED, AND HEAT-TREATED CDTE SURFACES [J].

HARING, JP ;

WERTHEN, JG ;

BUBE, RH ;

GULBRANDSEN, L ;

JANSEN, W ;

LUSCHER, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1469-1472

[6] ETCH PITS AND POLARITY IN CDTE CRYSTALS [J].

INOUE, M ;

TAKAYANAGI, S ;

TERAMOTO, I .

JOURNAL OF APPLIED PHYSICS, 1962, 33 (08) :2578-&

[7] SEEDED GROWTH OF LARGE SINGLE-GRAIN CDTE FROM THE VAPOR-PHASE [J].

KUWAMOTO, H .

JOURNAL OF CRYSTAL GROWTH, 1984, 69 (01) :204-206

[8] ETCH PIT STUDIES IN CDTE CRYSTALS [J].

LU, YC ;

ROUTE, RK ;

ELWELL, D ;

FEIGELSON, RS .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (01) :264-270

[9] DETERMINATION OF CRYSTALLOGRAPHIC POLARITY OF CDTE CRYSTALS WITH AUGER-ELECTRON SPECTROSCOPY [J].

LU, YC ;

STAHLE, CM ;

MORIMOTO, J ;

BUBE, RH ;

FEIGELSON, RS .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (03) :924-927

[10] CALCULATED AUGER YIELDS AND SENSITIVITY FACTORS FOR KLL-NOO TRANSITIONS WITH 1-10 KV PRIMARY BEAMS [J].

MROCZKOWSKI, S ;

LICHTMAN, D .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (04) :1860-1865

← 1 2 →