PHYSICAL DEGRADATION OF A-SI FILMS ON THERMAL-TREATMENT - A SCANNING ELECTRON-MICROSCOPE STUDY

被引:9
作者
JOHN, P
ODEH, IM
THOMAS, MJK
TRICKER, MJ
WILSON, JIB
DHARIWAL, RS
机构
[1] HERIOT WATT UNIV,DEPT PHYS,EDINBURGH EH1 1HX,MIDLOTHIAN,SCOTLAND
[2] HERIOT WATT UNIV,DEPT ELECT & ELECTR ENGN,EDINBURGH EH1 1HX,MIDLOTHIAN,SCOTLAND
关键词
D O I
10.1007/BF01033846
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1305 / 1309
页数:5
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