XPS INVESTIGATION OF THE SURFACE-COMPOSITION OF SPUTTERED YBCO THIN-FILMS

被引:20
作者
BEYER, J
SCHURIG, T
MENKEL, S
QUAN, Z
KOCH, H
机构
[1] PHYS TECH BUNDESANSTALT,D-10587 BERLIN,GERMANY
[2] HUMBOLDT UNIV BERLIN,FACHBEREICH PHYS,D-10117 BERLIN,GERMANY
来源
PHYSICA C | 1995年 / 246卷 / 1-2期
关键词
D O I
10.1016/0921-4534(95)00159-X
中图分类号
O59 [应用物理学];
学科分类号
摘要
Post-growth in-situ XPS spectra of c-axis oriented YBCO thin films deposited by hollow cathode discharge sputtering on (100) MgO and (001) YSZ buffered r-plane sapphire have been measured. The XPS data have been quantitatively analyzed and show evidence of a BaO/CuO2/Y/CuO2/BaO/CuO/BaO layer sequence on the surface of the films grown on MgO substrates. The behavior of the XPS spectra of Ba in the case of YBCO on YSZ/sapphire is qualitatively different from that of YBCO on MgO.
引用
收藏
页码:156 / 162
页数:7
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