ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY WITH A COMBINATION ATOMIC FORCE MICROSCOPE SCANNING TUNNELING MICROSCOPE

被引：18

作者：

MARTI, O

DRAKE, B

GOULD, S

HANSMA, PK

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 03期

关键词：

D O I：

10.1116/1.575191

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2089 / 2092

页数：4

共 18 条

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[7] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J].

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[8]

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[9] SCANNING TUNNELING MICROSCOPY [J].

HANSMA, PK ;

TERSOFF, J .

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[10] ATOMIC RESOLUTION ATOMIC FORCE MICROSCOPY OF GRAPHITE AND THE NATIVE OXIDE ON SILICON [J].

MARTI, O ;

DRAKE, B ;

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HANSMA, PK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :287-290

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