EFFECTS OF SURFACE-ROUGHNESS ON BACKSCATTERING SPECTRA

被引:37
作者
KNUDSON, AR
机构
来源
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期
关键词
D O I
10.1016/0029-554X(80)91247-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:163 / 167
页数:5
相关论文
共 7 条
[1]   SURFACE-ROUGHNESS USING RUTHERFORD BACKSCATTERING [J].
BILL, U ;
EDGE, RD .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (01) :1812-1814
[2]   TILTING ANGLE DEPENDENCE OF RUTHERFORD BACKSCATTERING - UNIFORMITY OF NEAR-SURFACE LAYERS [J].
CAMPISANO, SU ;
CIAVOLA, G ;
COSTANZO, E ;
FOTI, G ;
RIMINI, E .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :229-233
[3]   SURFACE-TOPOLOGY USING RUTHERFORD BACKSCATTERING [J].
EDGE, RD ;
BILL, U .
NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3) :157-162
[4]   SOME GENERAL FEATURES OF RANDOM ELASTIC-SCATTERING SPECTRA [J].
JACK, HE .
THIN SOLID FILMS, 1973, 19 (02) :267-279
[5]   MEASUREMENT OF OXYGEN AND NITROGEN PROFILES IN STEEL [J].
NIILER, A ;
BIRKMIRE, R .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :301-305
[6]   BACKSCATTERING MEASUREMENTS AND SURFACE-ROUGHNESS [J].
SCHMID, K ;
RYSSEL, H .
NUCLEAR INSTRUMENTS & METHODS, 1974, 119 (02) :287-289
[7]   OPTIMIZATION OF A RUTHERFORD BACKSCATTERING GEOMETRY FOR ENHANCED DEPTH RESOLUTION [J].
WILLIAMS, JS .
NUCLEAR INSTRUMENTS & METHODS, 1975, 126 (02) :205-215