SPATIAL UNIFORMITY OF QUANTUM EFFICIENCY OF A SILICON PHOTO-VOLTAIC DETECTOR

被引:10
作者
SCHAEFER, AR
GEIST, J
机构
[1] Washington, DC
来源
APPLIED OPTICS | 1979年 / 18卷 / 12期
关键词
D O I
10.1364/AO.18.001933
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In the course of investigating the spatial uniformity of response of a silicon detector, an extensive experiment was conducted to examine the correlation between changes in reflectance, internal and external quantum efficiency as a function of position and wavelength on the detector. The sensitivity of the technique was tested and demonstrated in several ways. The examined detector was found to be suitably uniform for absolute radiometric purposes, and the small changes observed in external quantum efficiency can be easily accounted for by the dead layer model. © 1979 Optical Society of America.
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页码:1933 / 1936
页数:4
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