AN EVANESCENT-MODE TESTER FOR CERAMIC DIELECTRIC SUBSTRATES

被引：49

作者：

KENT, G

机构：

[1] Dielectric Lab Inc, Cazenovia, NY,, USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1988年 / 36卷 / 10期

关键词：

D O I：

10.1109/22.6095

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

8

引用

收藏

页码：1451 / 1454

页数：4

相关论文

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