CHARACTERISTICS OF SUB-MICRON GATE GAAS-FETS WITH AL0.3GA0.7AS BUFFERS - EFFECTS OF INTERFACE QUALITY

被引:10
作者
KOPP, W [1 ]
MORKOC, H [1 ]
DRUMMOND, TJ [1 ]
SU, SL [1 ]
机构
[1] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
来源
ELECTRON DEVICE LETTERS | 1982年 / 3卷 / 02期
关键词
D O I
10.1109/EDL.1982.25472
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:46 / 48
页数:3
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