THE USE OF CF-252 TO MEASURE LATCHUP CROSS-SECTIONS AS A FUNCTION OF LET

被引：6

作者：

REIER, M

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期

关键词：

D O I：

10.1109/TNS.1986.4334656

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1642 / 1645

页数：4

共 7 条

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[5] AN EXPERIMENTAL-STUDY OF THE EFFECT OF ABSORBERS ON THE LET OF THE FISSION PARTICLES EMITTED BY CF-252 [J].

MAPPER, D ;

SANDERSON, TK ;

STEPHEN, JH ;

FARREN, J ;

ADAMS, L ;

HARBOESORENSEN, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4276-4281

[6]

Northcliffe L. S., 1970, NUCL DATA A, V7, P233

[7] INVESTIGATION OF HEAVY PARTICLE INDUCED LATCH-UP, USING A CF-252 SOURCE, IN CMOS SRAMS AND PROMS [J].

STEPHEN, JH ;

SANDERSON, TK ;

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HARDMAN, M ;

FARREN, J ;

ADAMS, L ;

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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1207-1211

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