CHARACTERISTICS OF CMOS DEVICES IN HIGH-ENERGY BORON-IMPLANTED SUBSTRATES

被引:7
作者
ZAPPE, HP
HU, CM
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D O I
10.1109/16.3361
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1029 / 1034
页数:6
相关论文
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