TRANSMISSION-LINE MODELING OF SUBSTRATE RESISTANCES AND CMOS LATCHUP

被引:11
作者
TROUTMAN, RR
HARGROVE, MJ
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D O I
10.1109/T-ED.1986.22600
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:945 / 954
页数:10
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共 12 条
[1]  
ADLER RB, 1960, ELECTROMAGNETIC ENER, pCH5
[2]   FINITE-ELEMENT ANALYSIS OF SEMICONDUCTOR-DEVICES - THE FIELDAY PROGRAM [J].
BUTURLA, EM ;
COTTRELL, PE ;
GROSSMAN, BM ;
SALSBURG, KA .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1981, 25 (04) :218-231
[3]   AN ANALYSIS OF THE MODES OF OPERATION OF PARASITIC SCRS [J].
DRESSENDORFER, PV ;
OCHOA, A .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4288-4291
[4]  
ESTREICH DB, 1980, G2019 STANF U STANF
[5]   LATCH-UP IN CMOS INTEGRATED-CIRCUITS [J].
GREGORY, BL ;
SHAFER, BD .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) :293-299
[6]  
GROVE AS, 1967, PHYS TECHNOL S, P78
[7]   A DISCUSSION OF THE ROLE OF DISTRIBUTED EFFECTS IN LATCH-UP [J].
OCHOA, A ;
DRESSENDORFER, PV .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4292-4294
[8]   LATCH-UP CONTROL IN CMOS INTEGRATED-CIRCUITS [J].
OCHOA, A ;
DAWES, W ;
ESTREICH, D .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5065-5068
[9]  
PAYNE RS, 1980, DEC IEDM, P248
[10]  
RABURN WD, 1980, DEC IEDM, P252