A DISCUSSION OF THE ROLE OF DISTRIBUTED EFFECTS IN LATCH-UP

被引:13
作者
OCHOA, A
DRESSENDORFER, PV
机构
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D O I
10.1109/TNS.1981.4335715
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:4292 / 4294
页数:3
相关论文
共 6 条
[1]   NEUTRON-IRRADIATION FOR PREVENTION OF LATCH-UP IN MOS INTEGRATED-CIRCUITS [J].
ADAMS, JR ;
SOKEL, RJ .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5069-5073
[2]  
BARNARD WJ, 1980, GOMAC 1980 DIGEST PA, P225
[3]   PREVENTION OF CMOS LATCH-UP BY GOLD DOPING [J].
DAWES, WR ;
DERBENWICK, GF .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (06) :2027-2030
[4]  
ESTREICH P, 1980, THESIS STANDFORD U
[5]  
Payne R. S., 1980, International Electron Devices Meeting. Technical Digest, P248
[6]   LATCH-UP ELIMINATION IN BULK CMOS LSI CIRCUITS [J].
SCHROEDER, JE ;
OCHOA, A ;
DRESSENDORFER, PV .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1735-1738