PHOTO-LUMINESCENT CHARACTERIZATION OF GAAS SOLAR-CELLS

被引:20
作者
PETTIT, GD
WOODALL, JM
HOVEL, HJ
机构
[1] IBM Thomas J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1063/1.91112
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photoluminescence excitation measurements are shown to accurately determine the spectral response of Ga1-xAlxAs-GaAs heterojunction solar cells. The technique is applicable to as-grown structures prior to processing into final devices and can also be used to study postgrowth techniques designed to enhance the spectral response of such devices. The measurements indicate that some surface recombination passivation is obtained with anodization.
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页码:335 / 337
页数:3
相关论文
共 7 条
[1]   PLASMA OXIDATION OF GAAS [J].
CHANG, RPH ;
SINHA, AK .
APPLIED PHYSICS LETTERS, 1976, 29 (01) :56-58
[2]   RADIATIVE RECOMBINATION FROM GAAS DIRECTLY EXCITED BY ELECTRON BEAMS [J].
CUSANO, DA .
SOLID STATE COMMUNICATIONS, 1964, 2 (11) :353-358
[3]   NEW ANODIC NATIVE OXIDE OF GAAS WITH IMPROVED DIELECTRIC AND INTERFACE PROPERTIES [J].
HASEGAWA, H ;
FORWARD, KE ;
HARTNAGEL, HL .
APPLIED PHYSICS LETTERS, 1975, 26 (10) :567-569
[4]  
HOVEL HJ, 1972 S GAAS BOULD, P205
[5]   OPTICAL ABSORPTION OF GALLIUM ARSENIDE BETWEEN 0.6 AND 2.75 EV [J].
STURGE, MD .
PHYSICAL REVIEW, 1962, 127 (03) :768-+
[6]   HIGH-EFFICIENCY GA1-XALXAS-GAAS SOLAR CELLS [J].
WOODALL, JM ;
HOVEL, HJ .
APPLIED PHYSICS LETTERS, 1972, 21 (08) :379-&
[7]   ISOTHERMAL ETCHBACK-REGROWTH METHOD FOR HIGH-EFFICIENCY GA1-XALXAS-GAAS SOLAR-CELLS [J].
WOODALL, JM ;
HOVEL, HJ .
APPLIED PHYSICS LETTERS, 1977, 30 (09) :492-493