THE USE OF PEAK TO BACKGROUND RATIOS (P/B) IN AES AND SAM - HAVE YOU EVER WISHED YOU WERE BETTER INFORMED

被引：11

作者：

ELGOMATI, MM ^{[1
]}

机构：

[1] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND

来源：

VACUUM | 1988年 / 38卷 / 4-5期

关键词：

discussion and the SERC for financiai support through the Alvey Project VLSI029. The referee has made a number of useful comments for the presentation of this work and is duly acknowledged;

D O I：

10.1016/0042-207X(88)90073-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：337 / 340

页数：4

共 11 条

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SURFACE AND INTERFACE ANALYSIS, 1984, 6 (06) :282-285

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SURFACE SCIENCE, 1985, 152 (APR) :877-883

[4] THE RELATION BETWEEN AUGER SIGNAL-TO-BACKGROUND RATIOS AND ATOMIC CONCENTRATION [J].

ELGOMATI, MM ;

MATTHEW, JAD ;

PRUTTON, M .

APPLIED SURFACE SCIENCE, 1985, 24 (02) :147-156

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[6] AN IMPORTANT STEP IN QUANTITATIVE AUGER ANALYSIS - THE USE OF PEAK TO BACKGROUND RATIO [J].

LANGERON, JP ;

MINEL, L ;

VIGNES, JL ;

BOUQUET, S ;

PELLERIN, F ;

LORANG, G ;

AILLOUD, P ;

LEHERICY, J .

SURFACE SCIENCE, 1984, 138 (2-3) :610-628

[7] ANGULAR DEPENDENCE OF AUGER-ELECTRON EMISSION FROM A SINGLE-CRYSTAL SPECIMEN [J].

MCDONNELL, L ;

WOODRUFF, DP .

VACUUM, 1972, 22 (10) :477-480

[8] SCANNING AUGER-ELECTRON MICROSCOPY WITH HIGH SPATIAL OR HIGH-ENERGY RESOLUTION [J].

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PEACOCK, D .

VACUUM, 1982, 32 (06) :351-357

[9]

PRUTTON M, 1983, J APPL PHY, V54, P347

[10]

SEKINE T, 1982, HDB AES JEOL LTD

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