A MODEL FOR CONDUCTOR FAILURE CONSIDERING DIFFUSION CONCURRENTLY WITH ELECTROMIGRATION RESULTING IN A CURRENT EXPONENT OF 2

被引：211

作者：

SHATZKES, M

LLOYD, JR

机构：

来源：

关键词：

D O I：

10.1063/1.336731

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3890 / 3893

页数：4

共 26 条

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