MODIFIED RELIABILITY EXPRESSION FOR ELECTROMIGRATION TIME TO FAILURE

被引：20

作者：

BOBBIO, A ^{[1
]}

SARACCO, O ^{[1
]}

机构：

[1] IST ELETTROTEC NAZL GALILEO FERRARIS,TORINO,ITALY

来源：

MICROELECTRONICS AND RELIABILITY | 1975年 / 14卷 / 5-6期

关键词：

D O I：

10.1016/0026-2714(75)90152-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：431 / 433

页数：3

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