AUGER STUDY OF CR-AU THIN-FILMS DEPOSITED ON ALUMINA AND SAPPHIRE

被引：13

作者：

WEINMAN, LS

ORENT, TW

LIU, TS

机构：

来源：

THIN SOLID FILMS | 1980年 / 72卷 / 01期

关键词：

D O I：

10.1016/0040-6090(80)90567-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：143 / 149

页数：7

共 16 条

[1] EFFECT OF VARYING OXIDIZING AND NITRIDING PARAMETERS ON SURFACE OF CR THIN-FILMS [J].

ALESSAND.EI ;

BRUSIC, V .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :83-&

[2] SELF-DIFFUSION IN CHROMIUM [J].

ASKILL, J ;

TOMLIN, DH .

PHILOSOPHICAL MAGAZINE, 1965, 11 (111) :467-&

[3] INTERFACIAL BEHAVIOR OF CR-AU FILMS IN THE 423-573-K TEMPERATURE-RANGE [J].

HAMPY, RE ;

YOST, FG ;

GANYARD, FP .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (01) :25-30

[4] QUANTITATIVE AUGER-ELECTRON ANALYSIS OF HOMOGENEOUS BINARY-ALLOYS - CHROMIUM IN GOLD [J].

HOLLOWAY, PH .

SURFACE SCIENCE, 1977, 66 (02) :479-494

[5] ANALYSIS OF GRAIN-BOUNDARY DIFFUSION IN THIN-FILMS - CHROMIUM IN GOLD [J].

HOLLOWAY, PH ;

AMOS, DE ;

NELSON, GC .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (09) :3769-3775

[6] OXIDATION OF THIN CHROMIUM FILMS [J].

HOPE, GA ;

RITCHIE, IM .

THIN SOLID FILMS, 1976, 34 (01) :111-114

[7] MEASUREMENT OF GRAIN-BOUNDARY DIFFUSION AT LOW-TEMPERATURE BY THE SURFACE-ACCUMULATION METHOD .2. RESULTS FOR GOLD-SILVER SYSTEM [J].

HWANG, JCM ;

PAN, JD ;

BALLUFFI, RW .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (03) :1349-1359

[8] GRAIN BOUNDARY DIFFUSION EFFECTS IN FILMS OF GOLD ON CHROMIUM [J].

KENRICK, PS .

NATURE, 1968, 217 (5135) :1249-&

[9]

LECLAIRE AD, 1963, BRIT J APPL PHYS, V14, P351

[10] GRAIN BOUNDARY AND LATTICE DIFFUSION IN POLYCRYSTALLINE BODIES [J].

LEVING, HS ;

MACCALLUM, CJ .

JOURNAL OF APPLIED PHYSICS, 1960, 31 (03) :595-599

← 1 2 →