K-X-RAY SPECTRA OF AMORPHOUS AND CRYSTALLINE SILICON

被引:21
作者
SENEMAUD, C
COSTALIMA, MT
机构
[1] Laboratoire de Chimie Physique, 11, rue Pierre et Marie Curie
关键词
D O I
10.1016/0022-3093(79)90044-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
K X-ray emission and absorption spectra of crystalline and amorphous silicon have been analysed and compared to band structure calculations. The experimental results confirm the influence of rings and bound-angle fluctuations on different regions of the valence and conduction band of amorphous silicon. © 1979.
引用
收藏
页码:141 / 148
页数:8
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