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DETERMINATION OF THE CENTROID DEPTHS OF SHALLOW IMPURITY PROFILES BY X-RAY-FLUORESCENCE SPECTROMETRY

被引：20
作者：
GRIES, WH
WYBENGA, FT
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1981年 / 3卷 / 06期
关键词：
D O I：
10.1002/sia.740030605
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：251 / 257
页数：7
相关论文
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