AN ANALYSIS OF WEAK-BEAM ALPHA-FRINGES FORMED BY SYSTEMATIC DIFFRACTIONS

被引：4

作者：

MIYAZAWA, K ^{[1
]}

ISHIDA, Y ^{[1
]}

SUGA, T ^{[1
]}

机构：

[1] UNIV TOKYO,INST IND SCI,TOKYO 106,JAPAN

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1988年 / 58卷 / 05期

关键词：

D O I：

10.1080/01418618808209957

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：825 / 832

页数：8

共 9 条

[1]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[2] DETERMINATION OF THE BURGERS VECTOR OF A DISLOCATION BY WEAK-BEAM IMAGING IN A HVEM [J].

ISHIDA, Y ;

ISHIDA, H ;

KOHRA, K ;

ICHINOSE, H .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1980, 42 (04) :453-462

[3] DETERMINATION OF THE BURGERS VECTOR OF AN ISOLATED BOUNDARY DISLOCATION BY WEAK-BEAM HIGH-VOLTAGE ELECTRON-MICROSCOPY [J].

ISHIDA, Y ;

MIYAZAWA, K ;

MORI, M .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 53 (01) :131-140

[4] MEASUREMENT OF TRANSLATION COMPONENT AT ORDERED INTERFACES BY WEAK-BEAM ALPHA-FRINGE ELECTRON-MICROSCOPY [J].

MIYAZAWA, K ;

ISHIDA, Y .

JOURNAL OF MICROSCOPY-OXFORD, 1986, 142 :163-169

[5] WEAK-BEAM ALPHA-FRINGE ELECTRON-MICROSCOPY OF INTERFACE STRUCTURES [J].

MIYAZAWA, K ;

ISHIDA, Y .

ULTRAMICROSCOPY, 1987, 22 (1-4) :231-238

[6] PERIODIC GRAIN-BOUNDARY STRUCTURES IN ALUMINUM .1. COMBINED EXPERIMENTAL AND THEORETICAL INVESTIGATION OF COINCIDENCE GRAIN-BOUNDARY STRUCTURE IN ALUMINUM [J].

POND, RC ;

VITEK, V .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1977, 357 (1691) :453-&

[7]

POND RC, 1977, I PHYS C SER, V36, P247

[8]

REIMER L, 1984, TRANSMISSION ELECTRO

[9] ELECTRON DIFFRACTION FROM CRYSTALS CONTAINING STACKING FAULTS .1. [J].

WHELAN, MJ ;

HIRSCH, PB .

PHILOSOPHICAL MAGAZINE, 1957, 2 (21) :1121-1142

← 1 →