A REAL-TIME PHOTOLUMINESCENCE IMAGING-SYSTEM

被引：8

作者：

LIVESCU, G ^{[1
]}

ANGELL, M ^{[1
]}

FILIPE, J ^{[1
]}

KNOX, WH ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1990年 / 19卷 / 09期

关键词：

mapping; photoluminescence; Semiconductors;

D O I：

10.1007/BF02652919

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have developed a real-time photoluminescence imaging system. In contrast to scanning systems, in our set-up the photoluminescence is excited over the entire area of a sample at once. The intensity of the spectrally resolved emission from the whole sample is monitored and displayed in real-time, in a color-coded format. This system can be used for the quick inspection of optical and electro-optical materials, and is promising for in-situ characterization. As an example for the performance of the system we show data obtained on a GaAs/AlGaAs p-i-n quantum well modulator, and on an InP substrate. © 1990 AIME.

引用

页码：937 / 942

页数：6

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