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CORRELATION OF CRYSTAL DEFECTS AND BIPOLAR DEVICE BEHAVIOR
被引:7
作者
:
KRANZER, D
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
KRANZER, D
[
1
]
LEMME, R
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
LEMME, R
[
1
]
KOLBESEN, BO
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
KOLBESEN, BO
[
1
]
MAYER, KR
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAYER, KR
[
1
]
STRUNK, H
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
STRUNK, H
[
1
]
机构
:
[1]
MAX PLANCK INST MET RES,STUTTGART,FED REP GER
来源
:
REVUE DE PHYSIQUE APPLIQUEE
|
1978年
/ 13卷
/ 12期
关键词
:
D O I
:
10.1051/rphysap:019780013012080300
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:803 / 807
页数:5
相关论文
共 7 条
[1]
EMITTER-COLLECTOR SHORTS IN BIPOLAR-DEVICES
BARSON, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,E FISHKILL,NY 12533
IBM CORP,DIV SYST PROD,E FISHKILL,NY 12533
BARSON, F
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(04)
: 505
-
510
[2]
BUIE J, 1975, INTERCON, P1
[3]
ERNST H, 1977, SIEMENS FORSCH ENTW, V6, P86
[4]
FOLL H, 1977, SEMICONDUCTOR SILICO, P740
[5]
GRIENAUER H, 1976, SIEMENS Z, V60, P116
[6]
KOLBESEN BO, 1977, 5TH P INT C HIGH VOL, P637
[7]
MAPPING OF ELECTRICAL LEAKAGE IN TRANSISTORS BY ANODIC-OXIDATION
KULKARNI, MV
论文数:
0
引用数:
0
h-index:
0
KULKARNI, MV
JAMES, GAA
论文数:
0
引用数:
0
h-index:
0
JAMES, GAA
HASSON, JC
论文数:
0
引用数:
0
h-index:
0
HASSON, JC
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(10)
: 1098
-
&
←
1
→
共 7 条
[1]
EMITTER-COLLECTOR SHORTS IN BIPOLAR-DEVICES
BARSON, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,E FISHKILL,NY 12533
IBM CORP,DIV SYST PROD,E FISHKILL,NY 12533
BARSON, F
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1976,
11
(04)
: 505
-
510
[2]
BUIE J, 1975, INTERCON, P1
[3]
ERNST H, 1977, SIEMENS FORSCH ENTW, V6, P86
[4]
FOLL H, 1977, SEMICONDUCTOR SILICO, P740
[5]
GRIENAUER H, 1976, SIEMENS Z, V60, P116
[6]
KOLBESEN BO, 1977, 5TH P INT C HIGH VOL, P637
[7]
MAPPING OF ELECTRICAL LEAKAGE IN TRANSISTORS BY ANODIC-OXIDATION
KULKARNI, MV
论文数:
0
引用数:
0
h-index:
0
KULKARNI, MV
JAMES, GAA
论文数:
0
引用数:
0
h-index:
0
JAMES, GAA
HASSON, JC
论文数:
0
引用数:
0
h-index:
0
HASSON, JC
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(10)
: 1098
-
&
←
1
→