STUDY OF RADIATION DAMAGE IN SILICON WITH SCANNING ELECTRON MICROSCOPE

被引:10
作者
DAVIDSON, SM
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10.1038/227487a0
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O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
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页码:487 / &
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