APPLICATION OF SIMS IN POLYMERS AND LIGNOCELLULOSIC MATERIALS

被引:4
作者
HUA, XJ
KALIAGUINE, S
KOKTA, BV
机构
[1] UNIV QUEBEC,CRPP,TROIS RIVIERES GA9 5H7,QUEBEC,CANADA
[2] UNIV LAVAL,DEPT GEN CHIM,QUEBEC CITY G1K 7P4,QUEBEC,CANADA
关键词
D O I
10.1002/app.1993.070480101
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Secondary Ion Mass Spectrometry (SIMS), a new surface analysis technique, as begun to be applied to the studies of organic macromolecule surfaces either for chemical imaging and functional group analysis or for the determination of molecular weight distribution. The instrumental conditions that are critical for obtaining a meaningful spectrum are discussed for polymers which have properties similar to lignocellulosic materials, i.e., they are thermally fragile and electrically insulating. Examples are given for qualitative and quantitative analyses. Possible uses of SIMS for characterization of lignocellulosic materials are suggested.
引用
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页码:1 / 12
页数:12
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共 72 条
[1]  
AKHTAR S, 1988, POLYM MATER SCI ENG, V59, P1135
[2]   COLLECTION AND SPUTTERING EXPERIMENTS WITH NOBLE GAS IONS [J].
ALMEN, O ;
BRUCE, G .
NUCLEAR INSTRUMENTS & METHODS, 1961, 11 (02) :257-278
[3]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY - DETECTION OF FRAGMENTS FROM THICK POLYMER-FILMS IN THE RANGE M/Z-LESS-THAN-OR-EQUAL-TO-4500 [J].
BLETSOS, IV ;
HERCULES, DM ;
MAGILL, JH ;
VANLEYEN, D ;
NIEHUIS, E ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1988, 60 (09) :938-944
[4]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMERS IN THE MASS RANGE 500-10000 [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A .
MACROMOLECULES, 1987, 20 (02) :407-413
[5]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF NYLONS - DETECTION OF HIGH MASS FRAGMENTS [J].
BLETSOS, IV ;
HERCULES, DM ;
GREIFENDORF, D ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1985, 57 (12) :2384-2388
[6]  
BRENNA JT, 1989, MICROBEAM ANAL, V24, P306
[7]   ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J].
BRIGGS, D ;
WOOTTON, AB .
SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) :109-115
[8]   ANALYSIS OF POLYMER SURFACES BY SIMS .5. THE EFFECTS OF PRIMARY ION MASS AND ENERGY ON SECONDARY ION RELATIVE INTENSITIES [J].
BRIGGS, D ;
HEARN, MJ .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 67 (01) :47-56
[9]  
BRIGGS D, 1988, POLYM COMMUN, V29, P6
[10]   RECENT ADVANCES IN SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR POLYMER SURFACE-ANALYSIS [J].
BRIGGS, D .
BRITISH POLYMER JOURNAL, 1989, 21 (01) :3-15