THE IMPLICATION OF FLOW-RATE DEPENDENCIES IN PLASMA-ETCHING

被引:30
作者
CHAPMAN, BN
HANSEN, TA
MINKIEWICZ, VJ
机构
[1] IBM CORP,DIV DATA SYST,HOPEWELL JUNCTION,NY 12533
[2] IBM CORP,RES LAB,SAN JOSE,CA 95114
关键词
PLASMAS; -; Applications;
D O I
10.1063/1.328214
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of gas flow rates in the etching of silicon materials in fluorocarbon gases has been studied. A utilization factor has been defined to describe the extent to which the reaction gas is converted to volatile products of the plasma etching process. The experimental evidence for the importance of a utilization factor in plasma etching is shown, and some of the surprisingly many ways in which flow rates influence the whole etching process are illustrated.
引用
收藏
页码:3608 / 3613
页数:6
相关论文
共 3 条
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[2]   TRIODE PLASMA ETCHING [J].
MINKIEWICZ, VJ ;
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APPLIED PHYSICS LETTERS, 1979, 34 (03) :192-193
[3]   PLASMA ETCHING - PSEUDO-BLACK-BOX APPROACH [J].
WINTERS, HF ;
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