SIMULATION AND INTERPRETATION OF STEM SIDE-BAND HOLOGRAMS

被引：1

作者：

KONNERT, J

DANTONIO, P

机构：

[1] Laboratory for the Structure of Matter, Naval Research Laboratory, Washington

来源：

ULTRAMICROSCOPY | 1992年 / 45卷 / 3-4期

关键词：

D O I：

10.1016/0304-3991(92)90139-B

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Simulations of side-band holograms produced with a STEM equipped with a coherent, point electron source and a beam splitter are presented and interpreted. Holograms are calculated for various electron voltages, beam separations and thicknesses of GaAs [110]. The results illustrate features in a hologram associated with a stable, well-adjusted microscope. The simulations also provide data on the dynamic range and resolution necessary for recording the patterns and indicate techniques for removing from the reconstructed images interferences from unscattered beams.

引用

页码：281 / 290

页数：10

共 9 条

[1]

Cowley J.M., 1975, DIFFRACTION PHYS, V1

[2] HIGH-RESOLUTION SIDE-BAND HOLOGRAPHY WITH A STEM INSTRUMENT [J].