INFLUENCE OF THE SUBSTRATE MATERIAL ON THE GROWTH DIRECTION OF YBACUO THIN-FILMS

被引：36

作者：

JESCHKE, U ^{[1
]}

SCHNEIDER, R ^{[1
]}

ULMER, G ^{[1
]}

LINKER, G ^{[1
]}

机构：

[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH,INST NUKL FESTKORPERPHYS,D-76021 KARLSRUHE,GERMANY

来源：

PHYSICA C | 1995年 / 243卷 / 3-4期

关键词：

D O I：

10.1016/0921-4534(95)00019-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBaCuO thin films have been deposited by magnetron sputtering on various substrate materials like LaAlO3, NdGaO3, SrTiO3, MgO, Zr(Y)O-2 and Al2O3, and the transition from c-axis to a-axis growth orientation was studied as a function of the substrate temperature, T-s. Lattice mismatch appears to be the relevant parameter determining the temperature of the transition between these two growth directions. Good matching favors a-axis growth and a spread of 100 degrees C in T-s is observed between the border cases of MgO and NdGaO3 for the transition. In-plane alignment of a-axis films was observed on (110) NdGaO3 of rectangular surface symmetry. 80% of the grains were found to be aligned in the film plane by X-ray measurements. The resistivity anisotropy factor determined on patterned films along the [(1) over bar 10] and [001] substrate directions at T = 100 K amounted to 5.5.

引用

页码：243 / 251

页数：9

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