MOS TRANSISTORS WITH ANODICALLY FORMED METAL OXIDES AS GATE INSULATORS

被引:5
作者
WITT, W
HUBER, F
DELIVORI.P
机构
来源
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 05期
关键词
D O I
10.1109/PROC.1967.5633
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:687 / +
页数:1
相关论文
共 5 条
[1]   SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR [J].
HOFSTEIN, SR ;
HEIMAN, FP .
PROCEEDINGS OF THE IEEE, 1963, 51 (09) :1190-&
[2]  
HUBER F, 1966, ELECTRONIC COMPONENT
[3]  
HUBER F, 1965, 3 INT VAC C STUTTG
[4]   AC IMPEDANCE OF SEMICONDUCTOR-INSULATOR-METAL CAPACITORS [J].
LEHOVEC, K .
SOLID-STATE ELECTRONICS, 1963, 6 (05) :536-539
[5]   LIMITATIONS OF MOS CAPACITANCE METHOD FOR DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES [J].
ZAININGER, KH ;
WARFIELD, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1965, ED12 (04) :179-+