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MOS TRANSISTORS WITH ANODICALLY FORMED METAL OXIDES AS GATE INSULATORS
被引:5
作者
:
WITT, W
论文数:
0
引用数:
0
h-index:
0
WITT, W
HUBER, F
论文数:
0
引用数:
0
h-index:
0
HUBER, F
DELIVORI.P
论文数:
0
引用数:
0
h-index:
0
DELIVORI.P
机构
:
来源
:
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS
|
1967年
/ 55卷
/ 05期
关键词
:
D O I
:
10.1109/PROC.1967.5633
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:687 / +
页数:1
相关论文
共 5 条
[1]
SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR
[J].
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
;
HEIMAN, FP
论文数:
0
引用数:
0
h-index:
0
HEIMAN, FP
.
PROCEEDINGS OF THE IEEE,
1963,
51
(09)
:1190
-&
[2]
HUBER F, 1966, ELECTRONIC COMPONENT
[3]
HUBER F, 1965, 3 INT VAC C STUTTG
[4]
AC IMPEDANCE OF SEMICONDUCTOR-INSULATOR-METAL CAPACITORS
[J].
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
.
SOLID-STATE ELECTRONICS,
1963,
6
(05)
:536
-539
[5]
LIMITATIONS OF MOS CAPACITANCE METHOD FOR DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES
[J].
ZAININGER, KH
论文数:
0
引用数:
0
h-index:
0
ZAININGER, KH
;
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(04)
:179
-+
←
1
→
共 5 条
[1]
SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR
[J].
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
;
HEIMAN, FP
论文数:
0
引用数:
0
h-index:
0
HEIMAN, FP
.
PROCEEDINGS OF THE IEEE,
1963,
51
(09)
:1190
-&
[2]
HUBER F, 1966, ELECTRONIC COMPONENT
[3]
HUBER F, 1965, 3 INT VAC C STUTTG
[4]
AC IMPEDANCE OF SEMICONDUCTOR-INSULATOR-METAL CAPACITORS
[J].
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
.
SOLID-STATE ELECTRONICS,
1963,
6
(05)
:536
-539
[5]
LIMITATIONS OF MOS CAPACITANCE METHOD FOR DETERMINATION OF SEMICONDUCTOR SURFACE PROPERTIES
[J].
ZAININGER, KH
论文数:
0
引用数:
0
h-index:
0
ZAININGER, KH
;
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(04)
:179
-+
←
1
→