REFLECTIVITY USING NEUTRONS OR X-RAYS - A CRITICAL COMPARISON

被引：102

作者：

SINHA, SK ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,DEPT PHYS,UPTON,NY 11973

来源：

PHYSICA B | 1991年 / 173卷 / 1-2期

关键词：

D O I：

10.1016/0921-4526(91)90031-9

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The relative advantages and disadvantages of neutrons and X-rays for reflectivity studies are discussed in terms of intensities, resolutions, backgrounds and selectivities. The general but important question of how to separate the true specular reflectivity from the diffuse background is addressed. Finally, certain special cases of diffuse scattering, such as scattering from liquid surfaces and from multiple interfaces with correlated roughness, are discussed in detail.

引用

页码：25 / 34

页数：10

共 27 条

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