X-RAY-DIFFRACTION STUDY OF THE GE(001) RECONSTRUCTED SURFACE

[1] THEORY OF RECONSTRUCTION INDUCED SUBSURFACE STRAIN - APPLICATION TO SI(100) [J]. SURFACE SCIENCE, 1978, 74 (01) : 21 - 33

[2] BIRGENEAU RJ, 1980, ORDERING 2 DIMENSION

[3] ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (01) : 43 - 47

[4] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) : 1150 - 1161

[5] 3 INDEPENDENT LEED STUDIES OF CLEAN SI (100) SURFACES [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (08): : 1109 - 1119

[6] STRUCTURE OF RECONSTRUCTED SI(001)2 BY 1 AND GE(001)2 BY 1 SURFACES [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (12): : L455 - L461

[7] OBSERVATIONS OF CLEAN SURFACES OF SI GE AND GAAS BY LOW-ENERGY ELECTRON DIFFRACTION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (5-6) : 375 - &

[8] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J]. JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) : 729 - &

[9] STRUCTURAL AND ELECTRONIC MODEL OF NEGATIVE ELECTRON AFFINITY ON SI-CS-O SURFACE [J]. SURFACE SCIENCE, 1973, 34 (01) : 90 - 107

[10] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933

[1] THEORY OF RECONSTRUCTION INDUCED SUBSURFACE STRAIN - APPLICATION TO SI(100) [J]. SURFACE SCIENCE, 1978, 74 (01) : 21 - 33

[2] BIRGENEAU RJ, 1980, ORDERING 2 DIMENSION

[3] ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (01) : 43 - 47

[4] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) : 1150 - 1161

[5] 3 INDEPENDENT LEED STUDIES OF CLEAN SI (100) SURFACES [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (08): : 1109 - 1119

[6] STRUCTURE OF RECONSTRUCTED SI(001)2 BY 1 AND GE(001)2 BY 1 SURFACES [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (12): : L455 - L461

[7] OBSERVATIONS OF CLEAN SURFACES OF SI GE AND GAAS BY LOW-ENERGY ELECTRON DIFFRACTION [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (5-6) : 375 - &

[8] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J]. JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) : 729 - &

[9] STRUCTURAL AND ELECTRONIC MODEL OF NEGATIVE ELECTRON AFFINITY ON SI-CS-O SURFACE [J]. SURFACE SCIENCE, 1973, 34 (01) : 90 - 107

[10] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933