CONTINUOUS-WAVE PHOTOLUMINESCENCE EXCITATION-SPECTRA OF MULTIPLE NARROW-STEPPED QUANTUM-WELLS - EVIDENCE FOR SATURATION OF INTERFACE TRAPS

被引：32

作者：

DING, YJ

GUO, CL

LI, S

KHURGIN, JB

LAW, KK

MERZ, JL

机构：

[1] Department of Electrical and Computer Engineering, Johns Hopkins University, Baltimore

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 02期

关键词：

D O I：

10.1063/1.107000

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Continuous-wave photoluminescence excitation spectra of multiple narrow-stepped quantum wells at room temperature have been measured for the first time. It has been observed that photoluminescence intensity increases stronger than proportionally to the square of the laser intensity. This phenomenon can be attributed to the radiative recombination between free carriers in parallel with the dominant nonradiative recombination on the saturable interface traps. Intensity-dependent trapping efficiency and ratio between electron and hole nonradiative decay times, and the ratio between trapping and nonradiative recombination rates have been derived from the experiment.

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页码：154 / 156

页数：3

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