STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON - NEUTRON-DIFFRACTION AND REVERSE MONTE-CARLO INVESTIGATIONS

A neutron-diffraction measurement in the 0-23 angstrom-1 inverse space interval was performed on pure amorphous Si. With the structure factor obtained experimentally three-dimensional models were constructed by reverse Monte Carlo simulation for the determination of the atomic structure of a-Si. The radial distribution function was calculated directly from the large-scale models and was derived traditionally from these wide range spectra, as well.